Publication: Electrical field analysis using fem for various levels contamination coated on the surface of 11kv rated voltage glass type pin insulator
Loading...
Date
2023-07
Authors
Nur Hidayah binti Mohd Salleh
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
High voltage insulators are an essential component of high voltage electric power transmission networks. Any breakdown of the high voltage insulators will
undoubtedly result in some form of loss, as many sectors rely on the availability of a continuous power supply. Hence, the key goal of this research is to investigate the influence of various levels of contamination coated on the surface of an 11kV rated voltage glass type pin insulator on the electric field (EF) and electric potential distribution when measured using a single contamination profile. The contamination is performed on the 1512L outdoor glass type insulator that replicates the model with an applied voltage of 11kV. The contaminations were modelled as a uniform conductive coating with thicknesses of 1mm, 1.5mm, and 2mm, using the properties of seawater to mimic the transmission line near the ocean. COMSOL Multiphysics FEM analysis software is used for analysing the EF and electric potential distribution. The glass insulator is modelled in accordance with the IEC 60507 specification. According to the simulation results, the distributions of the EF and potential distribution measured on the top and bottom cutlines of the surface for all contamination profiles show the correct patterns. The electric potential decreased with the decline in contamination severity. When the contamination level changes from heavy to medium, light, and clean, the electrical potential at 36 mm increases from 2.69kV to 3.08kV, 3.10kV, and 3.56 kV, respectively. The magnitude and intensity of the EF are high at the contamination point and the interface medium's boundary. The EF at 35.5mm spikes to 0.40kV/mm, 0.47kV/mm, 0.90kV/mm, and 1.51kV/mm for clean, light, medium, and heavy contamination levels, respectively, for the top cutline while for the bottom cutline, the EF distribution is 0.41kV/mm at 13.6mm for clean
contamination level, compared to 1.21kV/mm, 1.22kV/mm, and 1.95kV/mm for light, medium, and heavy contamination levels, respectively. The high EF intensity is created by the high distortion of leakage current (LC) induced by contamination and dry band arcing, which enhances the insulator's rate of erosion. The contaminated insulator glass near the HV electrode terminal had the greatest impact on the potential and EF distribution pattern.