Publication: Test circuit for adc ic testing
Loading...
Date
2010-04-01
Authors
Hasbullah, Khadijah
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
A test circuit designed in this project consists of power supply circuit, dc biasing circuit, clock circuit and digital oscilloscope to test the characteristic of an ADC IC. A
theory, problem statement, solution to the problem, procedures of testing, result and conclusion for the project are included in this report. Specifically the project focused on
the designing and building of a test circuit to define the static characteristics of the newly designed 40 pins pipelined ADC IC. The test circuit is designed to provide a
cheaper solution to test the IC. A dc voltage supply of 3.3V is required to power up the ADC IC (𝑉𝐷𝐷 pin). The biasing voltage of five different values is also necessary for the
testing of the IC. These voltages are used to bias the transistors in the ADC IC (represented by BIAS1, BIAS2, BIAS3, BIAS4 and BIAS 5) are provided by the dc
biasing block also designed together with this test circuit. Other then biasing the transistor, the biasing circuit also provides reference voltage of 1.2V to the 𝑉𝑅𝐸𝐹 and
𝑉𝐶𝑀 pins. Both designs; the power supply circuit and biasing circuit must be done properly in order to hinder new interruption and produce a low noise voltage supply
critically required for the successful testing of the IC. An external clock circuit is also necessary to provide pulse supply to another 16 pins of the IC. Finally to do the testing
for the static characteristic of ADC, various dc voltages is fed to 𝑉𝐼𝑁+ and 𝑉𝐼𝑁− pin on the IC. The digital output word is displayed by the digital oscilloscope.