Develop audio codec V93K dual sites test solution including adc pga gain characterization tests
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Date
2019-06
Authors
Yeow Yi Jia
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Abstract
The complexity of semiconductor device has increased day by day due to the development of technology. This has challenged test program development process in order to reduce the manufacturing cost at the same time remain quality of the device. The significant increasing of complex and high speed devices lead to the need of high speed tester. The purpose of this project is to use high speed tester Advantest V93000 tester to develop test solution dual sites for audio codec TLV320AIC10 and characterize ADC PGA gain of audio codec TLV320AIC10. Before developing test solution for audio codec, test plan should be created to make sure there is no any step is skipped. Total 21 tests are developed in Smartest by referring to the test parameter, test plan and datasheet. The tests included continuity test, leakage test, functional test, supply current test, Vmid output voltage test, SCLK and FS frequency test, DAC test, ADC test and ADC PGA gain characterization test. Result for the test flow of audio codec site 1 and site 2 are pass. Each test has successfully obtained the result values within the test limits. ADC PGA gain has been successfully characterized also. Problem encountered during developing test suites for every test has been solved and debugged. Test development skill learnt through this project is very advantageous in future job finding and useful in industry. Other devices can be tested using Advantest V93000 tester in future.