Development of audio codec dual sites test solution using v93k including digital-to-analog converter (DAC) and analog-to-digital converter (ADC) tests in 16-bit mode
| dc.contributor.author | Theng Zing Sze | |
| dc.date.accessioned | 2021-02-23T03:57:34Z | |
| dc.date.available | 2021-02-23T03:57:34Z | |
| dc.date.issued | 2019-06 | |
| dc.description.abstract | Mixed signal testing is necessary especially when the complexity of integrated circuit (IC) design that involves both analog and digital signal is increasing tremendously. The use of an Automatic Test Equipment (ATE) is very much needed to achieve a comprehensive test coverage. This project focused on the production testing for the TLV320AIC10 audio codec by developing a dual sites test solution using Advantest V93K ATE. A test flow consists of a sequence of test suites was developed for common tests based on the test list given. In addition, two tests would focus on one of its characterizations, in which digital-to-analog converter (DAC) and analog-to-digital converter (ADC) testing were performed in both 15-bit (default mode) and 16-bit mode. After all the test suites were created, test run was executed and a PASS result was obtained in dual sites configuration. All the measurements taken at the test pins were within the test limits. For 15-bit mode operation, D0 needs to be pulled HIGH for a software secondary communication request. On the other hand, FC needs to be pulled HIGH for a hardware secondary communication request for 16-bit mode operation. The maximum number of distinction values that a 15-bit and 16-bit data word could hold was 5391 and 10780 respectively. This can be verified by comparing the amplitude of ADC sine waveforms. It can be concluded that the test solution developed was able to validate the performance of device under test (DUT) in meeting requirements stated in datasheet specification. | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/11475 | |
| dc.language.iso | en | en_US |
| dc.title | Development of audio codec dual sites test solution using v93k including digital-to-analog converter (DAC) and analog-to-digital converter (ADC) tests in 16-bit mode | en_US |
| dc.type | Other | en_US |
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