Developing audio codec v93k automated test equipment (ATE) test solution by applying the matchloop pattern commands to synchronize ate patterns to the device under test (DUT) clock outputs

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Date
2019-06
Authors
Mohd Syazwan Bin Sulaiman Najib
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Every new designed IC needs a test solution so it can be tested at a large scale. The test solution not been developed yet. The IC must be tested first on the test solution for it to be considered as a good IC. The purpose of this project is to develop a test solution for audio codec on Advantest V93K ATE. Objectives of this project is to develop audio codec dual site test solution and to apply match loop pattern to synchronize ATE patterns to DUT clock output. The audio codec had primary and secondary serial communication that play the major role in determining the result. The flow for this project must be start with pin configuration, level setup, timing setup, pattern setup and followed by the list of tests which were continuity, functional, leakage, functional WrRd, IddA, IddD VMID, SCLK and FS frequency test, ADC and DAC test. The finding of the project was all the test suit pass and goes to good bin for site 1 and site 2. The continuity test was passed in this test solution with around -480 mV result. The functional and functional WrRd were passed based on passed on functional pin. Leakage test gave 0 uA leakage current. VMID test gave 2.51424 V for site 1 while for site 2 was 2.49046 V. As for Analog Idd and Digital Idd, the results were 17273.536 uA and 1036.098 uA for site 1. 16668.230 uA and 1082.767 uA for site 2 respectively. As for other test, it all passed following the specification in the datasheet. All test was passed for both sites. It indicated that the IC in both sites were good to market and the test solution can be used for mass manufacturing testing.
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