On-wafer noise figure characterization for radio frequency integrated circuits.
| dc.contributor.author | Mohd, Shukri Korakkottil Kunhi | |
| dc.date.accessioned | 2018-10-16T02:24:55Z | |
| dc.date.available | 2018-10-16T02:24:55Z | |
| dc.date.issued | 2011-03 | |
| dc.description.abstract | Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. Dalam tesis ini, semua unsur yang terlibat ditentukan dan dikategorikan sebagai sistem berbilang tahapan. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. As implemented in this thesis, all elements involved in the setup were determined and classified as a multi-stage system. | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/6780 | |
| dc.language.iso | en | en_US |
| dc.publisher | Universiti Sains Malaysia | en_US |
| dc.subject | Noise | en_US |
| dc.subject | Frequency | en_US |
| dc.title | On-wafer noise figure characterization for radio frequency integrated circuits. | en_US |
| dc.type | Thesis | en_US |
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