Developing audio codec dual sites test solution using multiport feature of the V93K ate
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Date
2019-06
Authors
Tan, Zhe Jie
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Abstract
Integrated circuit (IC) testing is necessary to ensure reliability of electronic products,
and a popular IC testing option in the industry is developing test solution on the V93K
automated test equipment (ATE). Device Under Test (DUT) is the TLV320AIC10
Audio Codec. Digital test cards have limited storage of vector memory. If the test
requires large amount of vector in pattern, the pins of one port may need more memory
for their vectors than what is physically available. Therefore, this project aims to
develop a V93K dual sites test solution for audio codec and reduce vector memory
using Multiport Feature of the V93K. After thorough understanding of the device’s
datasheet and V93K ATE, DUT board is designed and fabricated. Then, 20 tests are
designed to test different parts of the audio codec. These tests are continuity, input
leakage, functional, supply current, VMID output voltage, frequency, DAC distortion
and ADC distortion test. Multiport is implemented in the functional and frequency test.
Result showed both site 1 and site 2 DUT passed all 20 tests. Total execution time is
0.652 second. Mixed signal tests took the longest time (39% of total) because more
setup time is needed. They involve more tester resources than other test. Compared to
normal test suite, multiport-enhanced test suite reduces 71% of vector memory in
Functional (N=32) test and 40% in Functional (N=4) test. In conclusion, multiport
implementation seen improvement in terms of pattern memory. This is advantageous
for tests that contains many vectors in the pattern. Great reduction of vector memory will see the effect of shorter test time and lower test cost in overall.