On-Wafer Noise Figure Characterization For Radio Frequency Integrated Circuits
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Date
2011-03
Authors
Kunhi Mohd, Shukri Korakkottil
Journal Title
Journal ISSN
Volume Title
Publisher
Universiti Sains Malaysia
Abstract
A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio
Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed
by gain uncertainty analysis to investigate the influences of scalar and vector
measurements on the NF. As implemented in this thesis, all elements involved in the
setup were determined and classified as a multi-stage system. Input cable and probe
as well as output cable and probe were both grouped into input and output stages, respectively.
Then, S-parameter for these input and output stages were measured using
one-port S-parameter measurement approach. Next, a well known Friis equation was
applied to correct the noise contributions coming from these stages. In order to validate
the proposed method, the de-embedding procedure was applied on a reference
design, where Low-Noise Amplifier (LNA) modeled MAX2654 from Maxim Integrated
Products was used. MAX2654 has the specification of 1.5 dB NF at 1.575 GHz.
At the frequency of operation, a difference of 0.17 dB attained by comparing Noise
Figure (NF) specification of reference design and the result of measurement that using
the de-embedding procedure. As opposed to 1.8 dB difference obtained without
the de-embedding method, the validation process has proven that the proposed method
contributes to a more accurate on-wafer NF measurement.
Description
Keywords
Noise Figure Characterization , Radio Frequency Integrated Circuits