On-Wafer Noise Figure Characterization For Radio Frequency Integrated Circuits

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dc.contributor.authorKunhi Mohd, Shukri Korakkottil
dc.date.accessioned2019-10-07T08:37:52Z
dc.date.available2019-10-07T08:37:52Z
dc.date.issued2011-03
dc.description.abstractA de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. As implemented in this thesis, all elements involved in the setup were determined and classified as a multi-stage system. Input cable and probe as well as output cable and probe were both grouped into input and output stages, respectively. Then, S-parameter for these input and output stages were measured using one-port S-parameter measurement approach. Next, a well known Friis equation was applied to correct the noise contributions coming from these stages. In order to validate the proposed method, the de-embedding procedure was applied on a reference design, where Low-Noise Amplifier (LNA) modeled MAX2654 from Maxim Integrated Products was used. MAX2654 has the specification of 1.5 dB NF at 1.575 GHz. At the frequency of operation, a difference of 0.17 dB attained by comparing Noise Figure (NF) specification of reference design and the result of measurement that using the de-embedding procedure. As opposed to 1.8 dB difference obtained without the de-embedding method, the validation process has proven that the proposed method contributes to a more accurate on-wafer NF measurement.en_US
dc.identifier.urihttp://hdl.handle.net/123456789/8966
dc.language.isoenen_US
dc.publisherUniversiti Sains Malaysiaen_US
dc.subjectNoise Figure Characterizationen_US
dc.subjectRadio Frequency Integrated Circuitsen_US
dc.titleOn-Wafer Noise Figure Characterization For Radio Frequency Integrated Circuitsen_US
dc.typeThesisen_US
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